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Exhibition News

[ATE] Semicon West 2008 2008-07-29
Writer Sam Kim
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Exhibition: Semicon West 2008

Location: Moscone Center, San Francisco, USA

Period: 2008.07.15 ~ 2008.07.17

Display: M500H (512para Memory Test Handler)

            M640A (8para Engineering Test Handler)

 

 

Semicon West is the largest flagship event for SEMI and is annually held at Moscone Center, San Francisco.

It is where virtually every major breakthrough in semiconductor manufacturing is introduced and a focal point for people inside and outside of the industry looking for the latest information, trends and technologies driving the future of semiconductor development.

This year the Semicon West exhibition was from July 15 to July 17 and 1,151 exhibitors participated.

 

Mirae introduced its worlds first high speed 512para Memory Test Handler, M500H, which can test 43,000 units per hour.

Also on display was an 8para Engineering Test Handler, M640A. Visitors and customers were very surprised of the high speed performance of the new M500H and M640A and it also drew much attention from other exhibitors.

 

Mirae is proud to provide a wide range of handlers from low para to high para at various performances to meet each and every global customer needs. Mirae also displayed its Probe Card and Hi-Fix products at the show.

 

Mirae officials were kept busy during the show as there were many on-site meeting request from visitors and customers.

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